Epsilon 3XLE is a tabletop energy dispersive X-ray fluorescence (EDXRF) spectrometer used for elemental analysis from carbon (C) to americium (Am) in areas from R&D to process control. Simple to operate, reliable and highly flexible, it is ideally suited for a wide range of industries and applications. Powered by the latest developments in excitation and detection technology, the instrument delivers outstanding analytical performance. The SDDUltra silicon drift detector in the Epsilon 3XLE enables analysis of ultra-light elements of even carbon, nitrogen and oxygen.